[内容简介]
本收系統地介紹了分析電子顯微學（AEM）的基本概念和操作技術，聚集于相戀和形變中位錯的AEM研究。同時通過大量的例子闡述衍射晶體學的物理概念和數學分析方法，例如相變中位向關系的定量預測等，以便讀者加深理解和拓展視野。
[目次]
Chapter 1　Analytical Electron Microscope (AEM)
　1.1　Brief introduction of AEM history
　1.2　Interaction between electrons and specimen and signals used byAEM
　1.3　Electron wavelength and electromagnetic lens
　　1.3.1　Electron wavelength
　　1.3.2　Electromagnetic lens
　1.4　Structure and function of AEM
　　1.4.1　Illumination system
　　1.4.2　Specimen holders
　　1.4.3　Imaging system
　　1.4.4　Image recording
　　1.4.5　Power supply system and vacuum system
　　1.4.6　Computer control　'
　1.5　The principle of imaging, magnifying and diffracting
　1.6　Theoretical resolution limit
　1.7　Depth of focus and depth of field
　1.8　Spherical aberration-c0rrected TEMs　References　
Chapter 2　Specimen Preparation
　2.1　Traditional techniques
　　2.1.1　Replica
　　2.1.2　Preparation of powders
　　2.1.3　Film preparation for plan view
　　2.1.4　Film preparation from a bulk metallic sample .
　　2.1.5　Film preparation from a bulk nonmetaltic sample.
　2.2　Special techniques　
　　2.2.1　Cross-sectional specimen preparation
　　2.2.2　Cleaving and small angle cleavage technique
　　2.2.3　Ultramicrotomy
　　2.2.4　Focused ion beam technique　References
Chapter 3　Electron Diffraction
　3.1　Comparison of electron diffraction with X-raydiffraction
　3.2　Conditions of diffraction
　　3.2.1　Geometric condition
　　3.2.2　Physical condition
　　3.2.3　Diffraction deviating from exact Bragg Condition
　3.3　Basic equation used for analysis of electron diffractionpattern
　 3.3.1　Diffraction in an electron diffractometer
　 3.3.2　Diffraction in a TEM
　3.4　Principle and operation of selected area electrondiffraction
　3.5　Rotation of image relative to diffraction pattern
　3.6　Diffraction patterns of polycrystal and theirapplications
　　3.6.1　Formation and geometric features of diffraction patternsfor polycrystal
　　3.6.2　Applications of ring patterns
　3.7　Geometric features of diffraction patterns of singlecrystals
　　3.7.1　Geometric features and diffraction intensity of a singlecrystal pattern
　　3.7.2　Indexing methods of single crystal diffractionpatterns　
　3.8　Main applications of single crystal pattern
　　3.8.1　Identification of phases
　　3.8.2　Determination of orientation relationship
　3.9　Diffraction spot shift by stacking faults and determination ofstacking fault probability
　　3.9.1　Diffraction from planar defect
　　3.9.2　Determination of stacking fault probability in HCPcrystal
　　3.9.3　Determination of stacking fault probability in FCCcrystal
　3.10　Systematic tilting technique and its applications
　　3.10.1　Systematic tilting technique by double tilt holder.
　　3.10.2　Determination of electron beam direction
　……
Chapter 4 Mathematics Analysis in Electron Diffraction andCrystallography
Chapter 5 Diffraction Contrast
Chapter 6 high Resolution and High Spatial Resolution of Analyticaelectron Microscopy
Appendix
Index